- Aug 19, 2019
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David Lanzendörfer authored
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David Lanzendörfer authored
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David Lanzendörfer authored
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- Aug 17, 2019
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David Lanzendörfer authored
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- Aug 14, 2019
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David Lanzendörfer authored
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- Aug 12, 2019
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David Lanzendörfer authored
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- Aug 11, 2019
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David Lanzendörfer authored
Will be discussed tonight in Mumble
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- Aug 09, 2019
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David Lanzendörfer authored
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- Aug 06, 2019
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David Lanzendörfer authored
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David Lanzendörfer authored
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- Aug 05, 2019
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David Lanzendörfer authored
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David Lanzendörfer authored
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David Lanzendörfer authored
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David Lanzendörfer authored
According to the actual process spec, there needs to be pad oxide and a layer of nitride as CMP end stop below the thick LTO. Updated the graphics accordingly
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- Aug 03, 2019
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David Lanzendörfer authored
Added wet station J cleaning step after semi-clean CMP step according to Michael
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David Lanzendörfer authored
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David Lanzendörfer authored
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David Lanzendörfer authored
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David Lanzendörfer authored
According to Michael, the wafers need to be put into RCA after CMPing in wetstation B3
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- Aug 02, 2019
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David Lanzendörfer authored
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David Lanzendörfer authored
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David Lanzendörfer authored
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- Aug 01, 2019
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David Lanzendörfer authored
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David Lanzendörfer authored
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- Jul 30, 2019
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David Lanzendörfer authored
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David Lanzendörfer authored
According to the input from some fellow process engineers I've now removed the serious issue of irreversible crystal damage during CMPing without nitride CMP end stop
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- Jul 25, 2019
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David Lanzendörfer authored
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- Jul 23, 2019
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David Lanzendörfer authored
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David Lanzendörfer authored
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David Lanzendörfer authored
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David Lanzendörfer authored
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David Lanzendörfer authored
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David Lanzendörfer authored
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David Lanzendörfer authored
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David Lanzendörfer authored
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David Lanzendörfer authored
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David Lanzendörfer authored
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David Lanzendörfer authored
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- Jul 22, 2019
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David Lanzendörfer authored
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David Lanzendörfer authored
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