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Commit b0944543 authored by David Lanzendörfer's avatar David Lanzendörfer
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Updating documentation

Will be discussed tonight in Mumble
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......@@ -30,7 +30,7 @@ except that the glass layer is the top oxide opening and doesn't get any more me
An example of the general flow can be seen in \autoref{chapter_silicide_and_cmp} where it already has been performed for the interface area between back end and front end process.
We deposit 150nm LTO and etch holes into it, in order to contact through to the lower layer.
We deposit 1\um LTO, CMP it and etch holes into it, in order to contact through to the lower layer.
For the first metal layer (\autoref{chapter_metal1}), the etch stop is silicide and we have to sputter Nickel, as a diffusion barrier, before we sputter any Aluminum,
because the $Ti Si_2$ would react with the Aluminum to an high resistivity material.
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......@@ -135,6 +135,11 @@ The unreacted titanium film on the dielectric layer such as $SiO_2$ or $SiN$ is
After 2-3 minutes in APM, at room temperature, with a bit mechanical help, all the unreacted Titanium should be gone and the oxide should become visible again.
Under \textbf{no circumstance} use a solvent containing HF, since $Ti Si_2$ dissolves in HF or any other Fluoride containing solutions.
Better cleaning results can be achieved by adding mechanical stress to the unreacted metal while having it inside the RCA-1 solution,
so if you can put it into an ultrasonic bath, the RCA-1 cleaning results can be improved by this.
\newpage
\subsection{CMP}\label{chapter_silicide_and_cmp}
After we formed all the active devices and added the silicide in order to reduce the sheet resistance of junctions and contacts we have to make sure that
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......@@ -26,7 +26,7 @@
\def\UpperMetalResist{9.0}
\def\UpperMoreMetalResist{16.0}
\def\CrossSectionOnly{0.2}
\def\CrossSectionOnly{0.3}
\def\CrossAndTopSection{0.2}
\def\CrossAndTopSectionBig{0.3}
......@@ -14,9 +14,9 @@
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